INTEGRATED CIRCUIT INSPECTION VIA ACOUSTIC MICROSCOPYWEGLEIN RD.1983; IEEE TRANSACTIONS ON SONICS AND ULTRASONICS; ISSN 0018-9537; USA; DA. 1983; VOL. 30; NO 1; PP. 40-42; BIBL. 10 REF.Article

GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPYWEGLEIN RD.1978; ELECTRON. LETTERS; GBR; DA. 1978; VOL. 14; NO 20; PP. 656-657; BIBL. 4 REF.Article

NONDESTRUCTIVE FILM THICKNESS MEASUREMENT ON INDUSTRIAL DIAMONDWEGLEIN RD.1982; ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 23; PP. 1003-1004; BIBL. 8 REF.Article

ACOUSTIC MICROSCOPY OF CURVED SURFACESWEGLEIN RD.1981; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1981; VOL. 38; NO 7; PP. 516-518; BIBL. 5 REF.Article

A MODEL FOR PREDICTING ACOUSTIC MATERIAL SIGNATURESWEGLEIN RD.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 3; PP. 179-181; BIBL. 11 REF.Article

AN ACOUSTIC GRAY SCALE FOR SCANNING ACOUSTIC MICROSCOPY AND DIAGNOSTIC ULTRASOUNDWEGLEIN RD.1979; ULTRASON. IMAG.; USA; DA. 1979; VOL. 1; NO 1; PP. 89-100; BIBL. 10 REF.Article

ACOUSTIC PROPERTIES OF SPUTTERED GLASS AT MICROWAVE FREQUENCIES.WEGLEIN RD.1976; APPL. PHYS. LETTERS; U.S.A.; DA. 1976; VOL. 29; NO 5; PP. 277-279; BIBL. 9 REF.Article

IMAGE RESOLUTION OF THE SCANNING ACOUSTIC MICROSCOPE.WEGLEIN RD; WILSON RG.1977; APPL. PHYS. LETTERS; U.S.A.; DA. 1977; VOL. 31; NO 12; PP. 793-796; BIBL. 11 REF.Article

CHARACTERISTIC MATERIAL SIGNATURES BY ACOUSTIC MICROSCOPY.WEGLEIN RD; WILSON RG.1978; ELECTRON, LETTERS; G.B.; DA. 1978; VOL. 14; NO 12; PP. 352-354; BIBL. 4 REF.Article

CHARACTERISTICS OF PERIODIC ACOUSTIC-SURFACE WAVE GRATING FILTERS.WEGLEIN RD; OTTO OW.1974; ELECTRON. LETTERS; G.B.; DA. 1974; VOL. 10; NO 6; PP. 68-69; BIBL. 10 REF.Article